IOLTS 2011 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- KeyDates -- Additional Information -- Committees

Scope

Issues related to on-line testing are increasingly important in modern electronic systems. In particular,the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental ata on these areas. The symposium also emphasizes on-line testing in the ontinuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and rganized by University of Athens and TIMA Laboratory.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologies
Radiation effects
Design for reliability
Design for variability
On-line power monitoring and control
On-line current, temperature, etc, monitoring
Secure circuit design
Fault-based attacks and counter measures
Self-checking circuits and coding theory

On-line testing of analog and mixed signal circuits
On-line testing in automotive, railway, avionics, industry
On-line testing in the continuous operation of large systems
Fielddiagnosis, maintainability and reconfiguration
Fault-tolerant and fail-safe systems
Dependability evaluation
Dependable systems design
On-line and off-line built-in self-test
Synthesis of on-line testable circuits

Submissions

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The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, papers should be allowed six pages in the IEEE Proceedings of theSymposium.

Key Dates

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Submission deadline: March 23, 2011
Notification of acceptance:April 29, 2011
Final copy deadline: May 16, 2011

Additional Information

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Submission Information		General Information
Dimitris Gizopoulos	Xavier Vera	Michael Nicolaidis	Antonis Paschalis
University of Piraeus Department of Informatics Piraeus, Greece Tel: +30 210 414 2372 dgizop@unipi.gr	Intel Barcelona Research Center Intel Labs Barcelona Barcelona, Spain Tel: +34938001020 xavier.vera@intel.com	TIMA Laboratory Grenoble, France Tel: +33 (0) 4 76 57 46 96 michael.nicolaidis@imag.fr	University of Athens Dept. of Informatics & Telecomm. Athens, Greece Tel: +30 210 727 5231 paschali@di.uoa.gr

Committees

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TBA

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts

The 17th IEEE International On-Line Testing Symposium(IOLTS 2011 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).